Events: Calendar

ISAMS2 Symposium

Title: ISAMS2 Symposium
Event Date: 12/9/2019 - 12/10/2019
Event Time: 8 a.m.
Event End: 5:30 p.m.

UCI CALIT2 Auditorium


A three-day symposium focusing on retrieval of hidden information at the sub-atomic scale by leveraging the novel instruments that capture electron scattering and energy loss at unprecedented time and energy scales.


Bob Sinclair – Stanford University
Professor Robert (Bob) Sinclair has been a faculty member in the Department of Materials Science & Engineering since 1977. He obtained his degrees in materials science at Cambridge University and was a postdoctoral scholar at the University of California, Berkeley for four years. His research has focused on the development and application of advanced transmission electron microscopy techniques, especially in situ high-resolution microscopy, to basic materials studies related to semiconductor devices, magnetic recording, nanotechnology in cancer research and energy systems. At Stanford, he has been Department Chair (2004-2014), Director of the Stanford Nanocharacterzation Laboratory (2002-2013), Director of the Big Overseas Studies Program (2010-2012) and Director of the Wallenberg Research Link (present). He was Chair of the National Academy of Sciences Committee on “Midsize Facilities: the Infrastructure for Materials Research” (2003-2006), and he received the Distinguished Scientist Award (Physical Sciences) from the Microscopy Society of America (2009), the David M. Turnbull Lectureship of the Materials Research Society (2012) and the John M. Cowley Distinguished Lectureship, Arizona State University (2015).
Deb Kelly – Penn State University
Dr. Deb Kelly's research focuses on innovative approaches to study biological systems, ranging from human viruses to cancer. Central to her work is high-resolution imaging, primarily cryo-Electron Microscopy (EM). Invasive breast cancer threatens the lives of women everywhere and there is no precise treatment for the disease. Her team has developed a tunable microchip toolkit to study mutations in the breast cancer susceptibility protein, BRCA1. Using this new tools, the Kelly lab expects to determine strategic insights for the molecular detection and prevention of BRCA1-related cancers. Her team is on the cutting edge of the burgeoning new field they call structural oncology.
Ian MacLaren - University of Glasgow
Ian MacLaren’s research concentrates on using electron microscopy to study the structure and chemistry of materials and devices at the nanoscale.
Current research mainly uses either: Quantitative electron energy loss spectroscopy including DualEELS and ultra-high energy loss spectroscopy and/or scanned diffraction and 4D-STEM using fast, pixelated, direct electron detectors.
These techniques are applied to a wide range of topics and materials including functional oxides, high-strength steels, optical coatings for high precision interferometry, infrared semiconductor devices, and mineral alteration in terrestrial and extraterrestrial processes.
Jim Zuo – University of Illinois, Urbana-Champaign
Jian-Min Zuo received his Ph.D. in Physics from Arizona State University in 1989. He then took a three-year postdoctoral fellowship at the National Science Foundation center for high-resolution electron microscopy and the Physics department at ASU. During this time he co-authored a book on electron microdiffraction with John Spence. Prior to joining the faculty at the University of Illinois, he was a research scientist in Physics at ASU and a visiting scientist to a number of universities and institutes in Germany, Japan, and Norway. His research during this period focused on the development of quantitative electron diffraction techniques and study of crystal electron density and bonding. At Illinois, Prof. Zuo has developed research programs focused on structure and property relationships in a range of materials, including metal nanoparticles, semiconductors, electroceramics, oxide interfaces, and nanotubes. He also has developed an ultrafast electron diffraction facility and atomic resolution scanning transmission electron microscopy and electron energy loss spectroscopy using the aberration-corrected electron microscope at the Center for Microanalysis of Materials. He has published more than 140 papers in scientific journals and several invited book chapters on electron diffraction and diffractive imaging. His honors include the JSPS (Japan Society for the Promotion of Science) postdoctoral fellowship, outstanding young oversea researcher award from National Science Foundation of China, and Chair of Excellence of French Nanoscience Foundation. Zuo is the recipient of the 2001 Burton Award of the Microscopy Society of America.
Juan Carlos Idrobo – Oak Ridge National Laboratory
Juan Carlos Idrobo is an R&D Staff Scientist at the Center for Nanophase Materials Sciences in Oak Ridge National Laboratory. His research consists of applying aberration-corrected scanning transmission electron microscopy techniques combined with first-principles calculations to study the structure, electronic, and optical properties of materials. Idrobo holds Physics degrees from Universidad de Los Andes in Colombia (B.Sc., 2000), University of Illinois at Chicago (master, 2003) and University of California (Ph.D., 2004).
Klaus van Benthem - University of California, Davis, CA
Klaus van Benthem is interested in the investigation of the functionalities of novel nano-materials. He uses electron microscopy tools to image nano-materials with atomic resolution and correlate their morphologies and atomic structures with nano-scale and macro-scale physical properties. His interests are also in the development of new strategies to investigate materials under more realistic environmental conditions, such as gas phases, liquids, electrical and mechanical fields, etc. His overall vision is the characterization of functional materials with atomic resolution under their anticipated working conditions, i.e., “at work”.
Microstructure evolution in ceramics, wetting and dewetting behavior of metal thin films, field-assisted sintering, aberration-corrected electron microscopy
van Benthem is interested in developing a fundamental mechanistic understanding of structure-property relationships and related phenomena in functional nanomaterials, focusing on defect structure evolution under externally-applied stress fields. His research group uses a variety of atomic-resolution electron microscopy techniques to explore wetting-dewetting phenomena of thin films, microstructure evolution during ceramic processing and the 3D assembly of individual nanoparticles. Combined with experiments on materials under real-world operating conditions, van Benthem's work provides unique insights into materials’ reliability under extreme conditions and the development of new manufacturing techniques.
van Benthem is the scientific director of the department's Advanced Materials Characterization and Testing Laboratory (AMCaT).
Ramasse, Quentin - University of Leeds
Areas of expertise: Scanning transmission electron microscopy; electron energy loss spectroscopy; 2D materials; complex oxides; nano-materials characterization.
Quentin Ramasse holds a joint Chair in Advanced Electron Microscopy at the School of Chemical and Process Engineering and School of Physics, University of Leeds. After an M.Eng. at Ecole Centrale Paris and an M.Math (Part III of the Mathematical Tripos) at the University of Cambridge, he obtained his Ph.D. in Physics from the University of Cambridge as a member of the Microstructural Physics Group working on optical aberration measurements methodologies for aberration-corrected scanning transmission electron microscopy (STEM). He then moved to the National Center for Electron Microscopy (NCEM) in Berkeley, a U.S. Department of Energy-funded user facility, initially for a postdoctoral fellowship before being appointed Staff Scientist. At NC